Structured highlight inspection of specular surfaces
نویسندگان
چکیده
منابع مشابه
Structured Highlight Inspection of Specular Surfaces
In this paper we describe an approach to illumination and imaging of specular surfaces which yields three-dimensional shape information. The structured highlight approach uses a scanned array of point sources and images of the resulting reflected highlights to compute local surface height and orientation. A prototype Structured Highlight INspection system, called SHINY, has been implemented and...
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ژورنال
عنوان ژورنال: IEEE Transactions on Pattern Analysis and Machine Intelligence
سال: 1988
ISSN: 0162-8828
DOI: 10.1109/34.3866